A new computationally assisted diagnostic to measure NO densities in atmospheric-pressure microplasmas by Optical Emission Spectroscopy (OES) is developed and validated against absorption spectroscopy in a volume Dielectric Barrier Discharge (DBD). The OES method is then applied to a twin surface DBD operated in N2 to measure the NO density as a function of the O2 admixture (0:1%–1%). The underlying rate equation model reveals that NO(A2Σ+) is primarily excited by reactions of the ground state NO(X2Π) with metastables N2(A3Σ+u).
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Release Date | 2021-02-03 |
Identifier | 6df02003-bed9-4395-a3c6-26bc028828da |
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Plasma Source Properties | Both plasma sources are driven by damped sine wave pulses with a microsecond rise time. The pulse repetition frequency is chosen as f = 1000 Hz, and the
voltage amplitude can be varied from 0 to 20 kVpp. Each high voltage (HV) pulse has a sequential profile with damped oscillations and a frequency of ~650 kHz. |
Language | English (United States) |
Plasma Source Procedure | The different nitrogen/oxygen gas mixtures are chosen as follows: 99.9%/0.1%, 99.5%/0.5%, and 99%/1%. The total gas flow amounts to 10 slm in case of the SDBD setup and to 2 slm for the VDBD setup. |
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Plasma Medium Properties | The different nitrogen/oxygen gas mixtures are chosen as follows: 99.9%/0.1%, 99.5%/0.5%, and 99%/1%. The total gas flow amounts to 10 slm in case of the SDBD setup and to 2 slm for the VDBD setup. |
Plasma Medium Procedure | Before gas mixtures were changed, the vessel was completely evacuated, to minimise impurities. |
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Contact Name | F. Kogelheide |
Contact Email | |
Plasma Diagnostic Properties | Capacitive voltage divider (P6015A; Tektronix)
Current monitor (Model 2877; Pearson Electronics)
Digital oscilloscope (LeCroy9459 DUAL 350 MHz; LeCroy)
Echelle spectrometer (ESA 4000; LLA Instruments, Germany)
Intensified charge‐coupled camera (ICCD, 4 Picos; Stanford Computer Optics)
Deuterium lamp (X2D2, Hamamatsu, Japan)
Spectrometer (QE65000, OceanOptics, USA) |
Public Access Level | Public |
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Data and Resources
Project Contact Name:
P. Awakowicz